The XIS-6545DV is an advanced X-Ray Inspection System (XIS) designed for dual-view x-ray screening. Its powerful dual generators provide upward and diagonal viewing angles of screened objects. Each view can be manipulated independently, allowing operators to perform rapid and in-depth inspections while simultaneously using different screening modes.
With Astrophysics best-in-class imaging software, the XIS-6545DV allows operators to inspect objects with colorful, high-contrast filters and identify materials, recognize objects, and isolate threats with increased speed and accuracy.
STANDARD FEATURES
- 6 Color Imaging
- Color and Black/White Imaging
- Geometric Image Distortion Correction
- High Penetration Function
- Organic/ Inorganic Imaging
- Picture Perfect
- Pseudo Color
- Real- Time Image Manipulation
- Atomic Z-Number Measurement
- Material Discrimination
- 9 Quadrant Zoom
- Continuous Scanning
- Continuous Zoom up to 64x
- Vertical Zoom Panning
- Auto Image Archiving
- Image Review
- Image Annotation
- JPEG Conversion
- Print Image Capable
- Multi-Tier Accessibility
- Network Ready
- Real-Time Self Diagnostic
- Reverse Monochrome
- Density Alert
- Threat Image Projection (TIP)
- Entry/ Exit Roller Tables